Emerson Expands Access to Centralized Test Management (NI SystemLink software platform) for Engineering Teams of All Sizes
Emerson launched a new edition of its NI SystemLinkTM software platform, which empowers teams of engineers to collaborate more effectively by remotely configuring and monitoring test systems comprised of NI PXI, NI CompactRIOTM, and data acquisition devices connected to PCs.
NI SystemLink connects test facilities to improve the quality, uptime and reliability of critical test programs by allowing engineers to track software revisions, device calibration and system utilization across various environments. This new version simplifies set-up and installation while maintaining a feature-rich environment tuned to the needs of most labs and test facilities, eliminating the long setup times and heavy IT involvement typically required by similar solutions.
Using built-in remote software deployment capabilities, device calibration reports, live data dashboards and more, NI SystemLink helps engineers working in validation labs and production facilities to save time and resources without the usual overhead of an IT enterprise infrastructure.
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“Product validation is moving faster than ever, and teams need quick, reliable access to data and tools that help them make decisions with confidence,” said Jim Schwartz, director of software for Emerson’s test and measurement business. “This new version puts the power of NI SystemLink into the hands of teams of all sizes. Native integration with NI TestStand, LabVIEW, and FlexLogger means less time setting up and more time getting results.”
Centralized test machine management allows engineers to securely index and store measurement data, accelerate root cause analysis, and monitor KPIs with out-of-the-box dashboards. By connecting people, processes and data, NI SystemLink enables collaboration across different departments and geographies, streamlining workflows and providing actionable insights. Designed for small labs, the new version delivers the same core functionality and superior benefits for as few as two test systems at a lower cost than previous editions.